Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems

Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems

James E. Potzick

Calibration of a 90 ̊V-notch weir using parameters other than upstream head

Robert Eli

National Voluntary Laboratory Accreditation Program

NVLAP (Program : U.S.)

Post-launch calibration of satellite sensors

Amelia M. Budge

Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems

Carol F. Vezzetti

Alpha-particle calibrations

J. M. R. Hutchinson

Quality assurance of U.S. Geological Survey stream current meters

E. F. Hubbard